E-Nano Newsletter (Issue 06)  Publishing Date: 2007-01-01 

Welcome to the issue nº06 of the "E-Nano Newsletter" that three-monthly provides scientific articles, reports and updated information on Nanotechnology and more specifically Emerging Nanoelectronics. The following contributions will be available

"Exploring the Limits of Ion Beam Technology" by J. Gierak, P. Hawkes, R. Jede and NanoFIB partners
Pico-Inside Integrated Project:
Review on Non-Contact Atomic Force Microscopy (NC-AFM)
"Dielectric Substrates for Anchoring Organic Molecules with Computing Functionally" by S. Hirth, F. Ostendrf, J. Schütte, R. Bechstein, A. Kühnle and M. Reichling
"Non-Contact AFM as Indispensable Tool for Investigation of Patterned Insulators" by A. Socoliuc, Th. Glatzel, O. Pfeiffer, E. Gnecco, A. Baratoff, L. Nony and E. Meyer
"Virtual AFM: NC-AFM from Experiments to Simulations" by O. Pfeiffer, L. Nony, D. Schär, A. Wetzel, A. Baratoff and E. Meyer
"Molecular-Resolved Imaging with Non-Contact Atomic Force Microscopy (NC-AFM)" by J.J. Kolodziej, B. Such, F. Krok, M. Goryl and M. Szymonski
"Atomic Resolution AFM on NaCl at 5K Using the QplPlus Sensor" by M. Maier, A. Bettac and A. Feltz

    Full Version (pdf format) - December 2006   


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