E-Nano Newsletter (Issue 06)  Publishing Date: 2007-01-01 

Welcome to the issue nº06 of the "E-Nano Newsletter" that three-monthly provides scientific articles, reports and updated information on Nanotechnology and more specifically Emerging Nanoelectronics. The following contributions will be available

Research:
"Exploring the Limits of Ion Beam Technology" by J. Gierak, P. Hawkes, R. Jede and NanoFIB partners
Pico-Inside Integrated Project:
Review on Non-Contact Atomic Force Microscopy (NC-AFM)
"Dielectric Substrates for Anchoring Organic Molecules with Computing Functionally" by S. Hirth, F. Ostendrf, J. Schütte, R. Bechstein, A. Kühnle and M. Reichling
"Non-Contact AFM as Indispensable Tool for Investigation of Patterned Insulators" by A. Socoliuc, Th. Glatzel, O. Pfeiffer, E. Gnecco, A. Baratoff, L. Nony and E. Meyer
"Virtual AFM: NC-AFM from Experiments to Simulations" by O. Pfeiffer, L. Nony, D. Schär, A. Wetzel, A. Baratoff and E. Meyer
"Molecular-Resolved Imaging with Non-Contact Atomic Force Microscopy (NC-AFM)" by J.J. Kolodziej, B. Such, F. Krok, M. Goryl and M. Szymonski
"Atomic Resolution AFM on NaCl at 5K Using the QplPlus Sensor" by M. Maier, A. Bettac and A. Feltz


    Full Version (pdf format) - December 2006   

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