nano tech Japan, the world’s leading nanotech exhibition and conference, will take place for the 12th time from January 30 to February 1st, 2013 at the International Exhibition Center "Tokyo Big Sight". The organizers expect more than 600 exhibitors from 23 countries/regions. All together 60,000 visitors are expected to discover the latest nano materials, nano fabrication technology and characterization & measurement technologies. http://www.nanotechexpo.jp/en/
Eleven collocated exhibitions such as Printable Electronics, the surface technology exhibitions ASTEC and SURTEC, Convertech JAPAN or InterAqua create synergies with application fields of nanotechnologies. http://www.nanotechexpo.jp/en/concurrent_events.html
A new One-to-one Business Matching System will assist visitors and exhibitors in finding potential business partners and in efficiently securing business meetings during the event. http://www.nanotechexpo.jp/en/icsbizmatch_nanotech.html
Seminars of the concurrent “nano week” program will focus on different aspects on nanotechnology. http://www.nanotechexpo.jp/en/nanoweek2013.html
For details, please contact:
nano tech executive committee c/o ICS Convention Design Sumitomo Corporation Jimbocho Bldg., 3-24 Kanda-Nishikicho, Chiyoda-ku,Tokyo 101-8449 JAPAN Phone:+81-3-3219-3567 Fax:+81-3-3219-3628 E-mail: nanotech(at)ics-inc.co.jp http://www.nanotechexpo.jp/en/
Zeiss was founded in 1846 by Carl Zeiss in Jena like a workshop for precision mechanics and optics. The Nano Technology Systems Division of Carl Zeiss SMT provides its customers with the latest leading-edge E-Beam technology. Within this division you will find over four decades of accumulated experience in the field of scanning electron microscopy and six decades of experience in the field of transmission electron microscopy. Our unique track record in E-Beam technology:
Carl Zeiss Meditec Iberia S.A.U. Ronda de Poniente, 15 28760 Tres Cantos (Madrid) Tl: 91 203 37 00 Fax: 91 203 37 01 E-mail: info(at)zeiss.es Web: http://www.smt.zeiss.com/nts
Founded in 1971, FEI Company is a leading supplier of Tools for Nanotech™ that enable research, development and manufacture of products at the Nanoscale. Our range of industry-leading DualBeam™ and single-column focused ion and electron beam hardware and software products enables manufacturers and researchers to keep pace with technology shifts and develop next generation technologies and products. FEI's Tools for Nanotechnology push the boundaries of microscope innovation—including breaking the 1Å image resolution barrier—to give you the lead in your field of study. Our SEM, TEM, ESEM™, and DualBeam™ instruments deliver enhanced 3D imaging, characterization and analysis capabilities for your materials and life science applications. Come see how our microscope solutions will help you meet the research challenges you encounter today, as well as your future applications needs.
FEI Europe B.V. Sucursal en España Maria de Portugal, 1 28050 Madrid Tel.: +34 91 566 94 50 Fax: +34 91 566 73 27 E-mail: support.fr.es(at)fei.com Web: www.fei.com
For more than two decades Raith GmbH has been developping and selling high-tech systems in the domain of nanotechnology worldwide. Main areas of operations are designing and manufacturing of systems enabling fabrication of superfine surface structures down to the range of less than 10 nanometers (Electron Beam Lithography) and semiconductor inspection tools for industry (defect review). Renowned customers like Infineon Technologies or the Massachusetts Institute of Technology in Boston avail themselves of the know-how Raith has acquired since its early being in business. With its highly educated staff of physicists, engineers and technicians Raith offers optimal service and support for answers to technical and application related questions. Worldwide Raith qualifies its personnel to provide fast and competent help to its customer requests. Since 1985 Raith has pioneered the way for SEM lithography. Today complete turnkey lithography system solutions complement Raith product portfolio. These systems are used in state-of-the-art research in Physics, Electrical Engineering and other R&D related fields.
ScienTec is specialized in the distribution of rigorously selected scientific equipments dedicated to field of surface analysis:
ScienTec objectively studies your individual needs, advises you and proposes the right product for your application. We can provide a specific service, with dedicated engineers for after-sales follow-up and support. ScienTec has the in-house expertise to analyze your problem and resolve it, by designing solutions using products and accessories from our range of electronics, optics, mechanics and data processing. Agilent Technologies provides innovative scanning probe microscopy (SPM) solutions for all academic research and industrial applications. The 5500 Series (PicoPlus) microscope is the "all-in-one" solution for applications such as biology, polymers, nanomaterials, electrochemistry...etc, and integrates a number of imaging techniques, such as Scanning Tunneling Microscopy (STM), Low Current STM, Contact Atomic Force Microscopy (AFM), MacMode AFM, including phase imaging, acoustic AC AFM, Lateral Force Microscopy, Current-Sensing AFM, Pulsed Force Mode (PFM), Magnetic Force Microscopy (MFM)...etc. Agilent Technologies has acquired the Nano Instruments business unit of MTS Systems Corporation. The acquisition of the Nano Instruments business will strengthen Agilent’s portfolio of instrumentation for imaging, characterizing and quantifying nano-mechanical material properties. Nanonics Imaging is the premier innovator of AFM and NSOM systems in the SPM market. Since its inception in 1997 and throughout the last ten years they have introduced to the SPM market new concepts in system functionality which in turn have supported the pursuit of new areas of scientific application. Nanonics contributions span from their revolutionary approach to NSOM imaging with cantilevered NSOM probes, to their introduction of dual tip/sample scanning AFM systems; and from their introduction of the first ever NSOM/AFM cryogenic systems to the first ever, Raman/AFM, Multiprobe AFM and SEM/AFM systems. Please contact us at info@scientec.fr or visit our web page www.scientec.fr for more information.
Owing to its experience and flexibility, Orsay Physics has developed high performance and high quality ion / electron columns that can be customised to every application. The innovative Canion FIB range Orsay Physics offers a serie of reliable Canion columns, developed and customised for a large range of applications like TEM sample preparation, Device modification, Machining of 3-D nanostructures, local implantation using various ion species, Auger microscopy, etc...for both universities and industry. Major equipment manufacturers also integrate Orsay Physics columns in their systems as well. . For more information, please contact us at nano@orsayphysics.com
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