Contact Person - Info
Degree: Dr./Professor
Name: Thomas
Surname: Zimmer
Department: IMS
Phone: +33 5 40 00 27 66
Position: Permanent staff
Short CV: 
Thomas Zimmer received the M.Sc. degree in physics from the University of Würzburg, Germany, in 1989 and the Ph.D. degree in electronics from the University Bordeaux 1, Talence, France, in 1992. From 1989 to 1990, he was with the Fraunhofer Institute, Erlangen, Germany. Since 1992, he is with the IMS Institute, Talence, France. Since 2003, he is Professor at the University Bordeaux 1. He has been (is) involved in a couple of national and European research projects like the European MEDEA+ and ENIAC programs, and in National Research Agency (ANR) projects. In particular, he has initiated the European FP7 IP project DOTFIVE. At the IMS lab, he is the leader of the research group “Nanoelectronics.” His research interests are focused on electrical compact modeling and characterization of HF devices such as HBT (SiGe, InP), graphene nanotubes and GFETs. He is a cofounder of XMOD Technologies and Senior Member IEEE. He has served as a Reviewer for many journals and participated on the Program Committee of several conferences. He has published more than 100 scientific articles and contributed to 5 books.